Ha Jong | Advanced Technology Group, CS Management Center, SAMSUNG ELECTRONICS CO., LTD
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概要
- Ha Jong Shinの詳細を見る
- 同名の論文著者
- Advanced Technology Group, CS Management Center, SAMSUNG ELECTRONICS CO., LTDの論文著者
関連著者
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Jeong Jae
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
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Ha J
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
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Park S
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
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Jung Gue
Electronic Component Reliability Center Samsung Sdi Co. Ltd
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Park Sang
Advanced Materials Research Laboratory Comtecs Ltd.
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Ha Jong
Advanced Technology Group, CS Management Center, SAMSUNG ELECTRONICS CO., LTD
著作論文
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))