Jung Gue | Electronic Component Reliability Center Samsung Sdi Co. Ltd
スポンサーリンク
概要
関連著者
-
Jeong Jae
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
-
Ha J
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
-
Park S
Advanced Technology Group Cs Management Center Samsung Electronics Co. Ltd
-
Jung Gue
Electronic Component Reliability Center Samsung Sdi Co. Ltd
-
Park Sang
Advanced Materials Research Laboratory Comtecs Ltd.
-
Ha Jong
Advanced Technology Group, CS Management Center, SAMSUNG ELECTRONICS CO., LTD
著作論文
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))