Aya Yoichiro | Materials And Devices Development Center Bu Sanyo Electric Co. Ltd.
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概要
関連著者
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Aya Yoichiro
Materials And Devices Development Center Bu Sanyo Electric Co. Ltd.
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YAMASAKI Satoshi
National Institute for Advanced Interdisciplinary Research
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Ando Atsushi
National Inst. Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Wakisaka Kenichiro
Materials And Devices Development Center Bu Sanyo Electric Co. Ltd.
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Yamasaki Satoshi
National Institute Of Advanced Industrial Science And Technology (aist)
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WAKISAKA Kenichiro
Materials and Devices Development Center BU, Sanyo Electric Co., Ltd.
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Wakisaka K
Sanyo Electric Co. Ltd. Hirakata‐shi Jpn
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Ando Atsushi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Nishio Koji
Materials And Devices Development Center Bu Sanyo Electric Co. Ltd.
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WAKISAKA Kenichio
Materials and Devices Development Center BU, Sanyo Electric Co., Ltd.
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TAKEDA Katsutoshi
Materials and Devices Development Center BU, Sanyo Electric Co., Ltd.
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Takeda Katsutoshi
Materials And Devices Development Center Bu Sanyo Electric Co. Ltd.
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Wakisaka Kenichiro
Materials and Devices Development Center BU, Sanyo Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
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Aya Yoichiro
Materials and Devices Development Center BU, Sanyo Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
著作論文
- Conductive-Mode Atomic Force Microscopy Study of Amorphous Silicon Nitride Thin Films
- Topography and Local Electrical Properties of Nondoped Polycrystalline Silicon Thin Films Evaluated Using Conductive-Mode Atomic Force Microscopy
- Electrical Properties of Polycrystalline Si_ Ge_x Thin-Films Prepared by a Solid-Phase Crystallization Method
- Topography and Local Electrical Properties of Nondoped Polycrystalline Silicon Thin Films Evaluated Using Conductive-Mode Atomic Force Microscopy
- Conductive-Mode Atomic Force Microscopy Study of Amorphous Silicon Nitride Thin Films