Aoki Masakazu | Semiconductor and Integrated Circuits Division, Hitachi, Ltd.
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概要
関連著者
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Aoki Masakazu
Semiconductor and Integrated Circuits Division, Hitachi, Ltd.
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Aoki Masakazu
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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KAWAHARA Toshio
Department of Materials Science and Engineering, National Defense Academy
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Aoki M
Hitachi Ltd. Central Research Laboratory
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Nakayama Yoshinori
Central Research Laboratory Hitachi Ltd
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Nakagome Yoshinobu
Semiconductor Amp Integrated Circuits Div Hitachi Ltd.
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Kimura Katsutaka
Central Research Laboratory, Hitachi, Ltd.
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Masuda Hiroo
Semiconductor Technology Academic Research Center (starc)
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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Masuda Hiroo
Semiconductor Technology Academic Research Center
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Takeuchi K
Nec Corp. Sagamihara‐shi Jpn
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Aoki M
Ntt Network Service Systems Laboratories Ntt Corporation
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Aoki Masahiro
Hitachi Ltd. Central Research Laboratory
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Aoki M
Univ. Tsukuba Shizuoka Jpn
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Aoki Masakazu
Tokyo Univ. Sci. Chino‐shi Jpn
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Kawahara T
Semiconductor Leading Edge Technol. Inc. Tsukuba-shi Jpn
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Kawahara Takayuki
Central Research Laboratory Hitachi Ltd.
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Nakagome Y
Semiconductor Amp Integrated Circuits Div Hitachi Ltd.
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Ohkawa Shin‐ichi
Renesas Technol. Corp. Kodaira‐shi Jpn
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TAKEUCHI Kan
Semiconductor Development Center (c
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MATSUNO Katsumi
o
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Kimura K
Hitachi Ltd. Hitachi‐shi Jpn
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Kimura Katsutaka
Central Research Lab. Hitachi Ltd.
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OHKAWA Shinichi
Semiconductor Technology Academic Research Center (STARC)
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Matsuno Katsumi
O: Central Research Lab.) Semiconductor Amp Integrated Circuits Div Hitachi Ltd.
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Kawahara T
Faculty Of Technology Tokyo University Of Agriculture And Technology
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Matsuno Katsumi
Semiconductor Amp Integrated Circuits Div Hitachi Ltd.
著作論文
- Dynamic Terminations for Low-Power High-Speed Chip Interconnection in Portable Equipment
- Half-V_ltCCgt Plate Nonvolatile DRAMs with Ferroelectric Capacitors
- Design Guidelines and Process Quality Improvement for Treatment of Device Variations in an LSI Chip(Microelectronic Test Structures)