Matsuda Y | Microwave Device Development Department Mitsubishi Electric Corporation
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- MATSUDA Yoshioの詳細を見る
- 同名の論文著者
- Microwave Device Development Department Mitsubishi Electric Corporationの論文著者
Microwave Device Development Department Mitsubishi Electric Corporation | 論文
- Time-Dependent Leakage Current Behavior of Integrated Ba_Sr_TiO_3 Thin Film Capacitors during Stressing
- Temperature-Dependent Current-Voltage Characteristics of Fully Processed Ba_Sr_TiO_3 Capacitors Integrated in a Silicon Device
- Si LSI Process Technology for Integrating Ferroelectric Capacitors ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Application of Ferroelectric Thin Films to Si Devices (Special Issue on Quarter Micron Si Device and Process Technologies)
- A Digital Neural Network Coprocessor with a Dynamically Reconfigurable Pipeline Architecture (Special Issue on New Architecture LSIs)