Yi Insook | Material & Device Lab Samsung Advanced Institute Of Technology
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概要
関連著者
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Yi Insook
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung I
Microelectronics Laboratory Samsung Advanced Institute Of Technology
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Chung Ilsub
Material & Device Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Chung Ilsub
Microelectronics And Device Laboratory Samsung Advanced Institute Of Technology
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Kim C
Sait Suwon Kor
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Kim Chang
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Yi Insook
Materials And Devices Lab Samsung Advanced Institute Of Technology
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Yasutake Masatoshi
Material & Device Lab, Samsung Advanced Institute of Technology
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Yasutake Masatoshi
Seiko Instruments Inc.
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Yasutake M
Seiko Instruments Inc. Shizuoka Jpn
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Yasutake Masatoshi
Seiko Instruments & Electronics Scientific Instruments Department
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Chung Ilsub
Seiko Instruments Inc.
著作論文
- Application of Scanning Probe Microscope(SPM) for Novel Characterization of Ferrolectric Capacitor
- Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method
- Application of Scanning Probe Microscope(SPM)for Novel Characterization of Ferrolectric Capacitor
- Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method