Kuo Chien-li | United Microelectronics Corporation (umc) Central R&d Division
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概要
関連著者
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Kuo Chien-li
United Microelectronics Corporation (umc) Central R&d Division
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FANG Yean-Kuen
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
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Jung Le-tien
United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D
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Fang Yean-kuen
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Kuo Chien-li
United Microelectronics Corporation Central R&d Division
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Chen J.
United Microelectronics Corp. Logic Technology Department Technology & Process Development Divis
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Chen Daniel
United Microelectronics Corporation (umc) Central R&d Division
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CHEN T.
United Microelectronics Corp., Specialty Technology Department, Technology & Process Development Div
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CHIEN S.
United Microelectronics Corp., Specialty Technology Department, Technology & Process Development Div
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SUN S.
United Microelectronics Corp., Specialty Technology Department, Technology & Process Development Div
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Lin Tony
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Lin Tony
United Microelectronics Corp. Technology Development Division
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CHENG Osbert
United Microelectronics Corp. (UMC), CRD Logic Division
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LEE Tung-Hsing
VLSI technology Lab., Institute of Microelectronics, EE Department, National Cheng Kung University,
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HSU Elrick
United Microelectronics Corporation, Central R&D Division
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SHENG Tzermin
United Microelectronics Corporation, Central R&D Division
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CHIEN S
United Microelectronics Corporation, Central R&D Division
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Hsu Elrick
United Microelectronics Corporation Central R&d Division
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Sheng Tzermin
United Microelectronics Corporation Central R&d Division
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Lee Tung-hsing
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Cheng Osbert
United Microelectronics Corporation Central R&d Division
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Cheng Osbert
United Microelectronics Corp. (umc) Crd Logic Division
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Kuo Chien-Li
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Shen Tzermin
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Jung Le-Tien
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Shiau Wei-Tsun
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Yu Lorenzo
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Lin Tony
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Gong Yoyi
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Tseng Jung-Tsung
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Gong Yoyi
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Tseng Jung-Tsung
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
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Chen Daniel
United Microelectronics Corporation (UMC), Central R&D Division, No. 3, Li-Hsin Rd. 2, Science-Based Industrial Park, Hsin-chu city, Taiwan 30007, ROC
著作論文
- Effect of STI Stress Enhanced Boron Diffusion on Leakage and Vcc min of Sub-65nm node Low-Power SRAM
- Optimization of Active Geometry Configuration and Shallow Trench Isolation (STI) Stress for Advanced CMOS Devices