Cho Jun | Sungkyunkwan Univ. Suwon Kor
スポンサーリンク
概要
関連著者
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Cho Jun
Sungkyunkwan Univ. Suwon Kor
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梶谷 洋司
東京工業大学工学部電気・電子工学科
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藤吉 邦洋
北陸先端科学技術大学院大学情報科学研究科
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PARK Young
Semiconductor Materials Laboratory, Nano-device Research Center, Korea Institute of Science and Tech
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Lee Sang
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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梶谷 洋司
東京工業大学 大学院 理工学研究科 集積システム専攻
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Cho Jun
Sung Kyun Kwan Univ., Korea
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Sarrafzadeh Majid
Northwestern-Univ., USA
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Cho Jun
Sungkyunkwan University
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CHOI Soo
Semiconductor R&D Center, Samsung Electronics Co. Ltd.
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PARK Chul
Semiconductor R&D Center, Samsung Electronics Co. Ltd.
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YOO Moon
Semiconductor R&D Center, Samsung Electronics Co. Ltd.
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KIM Gyu
Korea University
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Choi Soo
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Yoo Moon
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Park Chul
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Cho Jun
Sung Kyun Kwan Univ. Korea
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Park Young
Semiconductor Materials Laboratory Korea Institute Of Science And Technology:department Of Physics K
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Sarrafzadeh Majid
Northwestern-univ. Usa
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Park Young
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Park Chul
Semiconductor Device Lab Samsung Advanced Institute Of Technology
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Park Young
Semicondactor Materials Laboratory Korea Insrirute Of Science And Technology
著作論文
- 枝重み付き一般グラフの最大マッチングの下限と線形時間近似アルゴリズム
- Suppression of Edge Effects Based on Analytic Model for Leakage Current Reduction of Sub-40nm DRAM Device