KUSAKA Kazuya | Faculty of Engineering, The University of Tokushima
スポンサーリンク
概要
関連著者
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KUSAKA Kazuya
Faculty of Engineering, The University of Tokushima
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Kusaka Kazuya
Department Of Mechanical Engineering Tokushima University
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Hanabusa Takao
Faculty Of Engineering Tokushima University
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Tominaga Kikuo
Dept. Of Electrical And Electronic Engineering Tokushima Univ.
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Tominaga Kikuo
Faculty Of Engineering The University Of Tokushima
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Hanabusa T
Department Of Mechanical Engineering Tokushima University
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MORI Ichiro
Faculty of Engineering, The University of Tokushima
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TOMINAGA Kikuo
Faculty of Engineering, The University of Tokushima
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HANABUSA Takao
Faculty of Engineering, The University of Tokushima
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Mori I
Faculty Of Engineering The University Of Tokushima
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Mori Ichiro
Faculty Of Engineering Osaka University
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SHINTANI Yoshihiro
Faculty of Engineering, Tokushima University
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Shintani Yoshihiro
Faculty Of Engineering The University Of Tokushima
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CHONG Mufei
Faculty of Engineering, The University of Tokushima
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Chong Mufei
Faculty Of Engineering The University Of Tokushima
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Tominaga K
Faculty Of Science Ehime University:(present) Rcnp Osaka University
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Sato Yoshifumi
Faculty Of Engineering The University Of Tokushima
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Kikuma T
Tokushima Univ. Tokushima Jpn
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AO Takahiro
Faculty of Engineering, The University of Tokushima
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Ao Takahiro
Faculty Of Engineering The University Of Tokushima
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FURUTANI Kouhei
Tokushima University
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KIKUMA Takuya
Tokushima University
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Saitoh Yoshifumi
Faculty of Engineering, the University of Tokushima
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Kusaka K
Faculty of Engineering, Tokushima University
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Furutani K
Tokushima University
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Hanabusa T
Faculty of Engineering, Tokushima University
著作論文
- Film Degradation in AlN Preparation by Facing Target System ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Influence of Target Shape on Properties of AlN Sputtered Film
- Gas Pressure Dependence of AIN Film Properties in Alternating Sputtering System
- Effect of Plasma Protection Net on Crystal Orientation and Residual Stress in Sputtered Gallium Nitride Films(Materials Evaluation by X-ray and Neutron Diffractions)