Kobayashi Tadayuki | University Of Electro-communications
スポンサーリンク
概要
関連著者
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Kobayashi Tadayuki
University Of Electro-communications
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Kobayashi Takashi
Central Research Laboratory Hitachi Ltd.
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MORIYA Masataka
University of Electro-Communications
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Moriya Masataka
University Of Electro-communication (uec Tokyo)
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Zhang L
Department Of Computer Science And Systems Engineering Faculty Of Engineering Yamaguchi University
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Goto T
University Of Electro-communications
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Zhang Lan
University Of Electro-communications
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GOTO Toshinari
University of Electro-Communications
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Mukaida M
Kyushu University
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Kobayashi Tadayuki
University Of Electro-communication (uec Tokyo)
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Kurata Hideaki
Central Research Laboratory Hitachi Ltd.
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Goto T
Graduate School Of Pharmaceutical Sciences Tohoku University
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Goto Takaaki
Department Of Electric Engineering Tokyo University Of Agriculture And Technology
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KOBAYASHI Takashi
Central Research Laboratory, Hitachi Ltd.
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MUKAIDA Masashi
Department of Electrical and Information Engineering, Yamagata University
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MUKAIDA Masashi
Yamagata University
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後藤 俊夫
名大農
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Kobayashi Tadayuki
Department Of Electronic Engineering The University Of Electro-communications
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KOBAYASHI Takayuki
University of Electro-Communications
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KIMURA Katsutaka
Hitachi Research Laboratory, Hitachi Ltd.
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Kimura Katsutaka
Hitachi Research Laboratory Hitachi Ltd.
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Kurata H
Central Research Laboratory Hitachi Ltd.
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Moriya Masataka
Department Of Electronic Engineering The University Of Electro-communications
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KUROIWA Keisuke
University of Electro-Communication (UEC Tokyo)
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MIZUGAKI Yoshinao
University of Electro-Communication (UEC Tokyo)
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後藤 俊夫
Graduate School of Pharmaceutical Sciences, Tohoku University
著作論文
- Sputtering Conditions and Properties of In-Plane-Aligned Y-Ba-Cu-O Films for Devices Application(Recent Progress in Oxide Thin Films by Sputtering)
- Fabrication and Properties of Planar Intrinsic Josephson Junctions with In-Plane Aligned YBCO Films(Special Issue on Superconductive Electronics)
- Trends in High-Density Flash Memory Technologies(Flash Memory)(New Era of Nonvolatile Memories)
- Evaluation of Two Methods for Suppressing Ground Current in the Superconducting Integrated Circuits