Sato Shin-ichiro | Takasaki Adv. Radiation Res. Institute Jsea
スポンサーリンク
概要
関連著者
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PARK Ji-Ho
Dept. of Electronics & Information Eng., Toyohashi Univ. of Tech.
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OKADA Hiroshi
Dept. of Electronics & Information Eng., Toyohashi Univ. of Tech.
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WAKAHARA Akihiro
Dept. of Electronics & Information Eng., Toyohashi Univ. of Tech.
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FURUKAWA Yuzo
Dept. of Electronics & Information Eng., Toyohashi Univ. of Tech.
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KIM Yong-Tae
Nano-Sci. Res. Center
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SONG Jonghan
Adv. Analysis Center, KIST
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CHANG Ho-Jung
Dept. of Electronics & Information Eng., Dankook Univ.
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SATO Shin-ichiro
Takasaki Adv. Radiation Res. Institute, JAEA
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OHSHIMA Takeshi
Takasaki Adv. Radiation Res. Institute, JAEA
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Chang Ho-jung
Dept. Of Electronics & Information Eng. Dankook Univ.
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Song Jonghan
Adv. Analysis Center Kist
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Furukawa Yuzo
Department Of Electrical And Electronic Information Engineering Toyohashi University Of Technology
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Furukawa Yuzo
Dept. Of Electronics & Information Eng. Toyohashi Univ. Of Tech.
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OKADA Hiroshi
Intelligent Sensing System Research Center, Toyohashi University of Technology
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WAKAHARA Akihiro
Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology
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Ohshima Takeshi
Takasaki Adv. Radiation Res. Institute Jsea
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Wakahara Akihiro
Department Of Electrical And Electronic Information Engineering Toyohashi University Of Technology
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Sato Shin-ichiro
Division Of Biotechnology And Macromolecular Chemistry Graduate School Of Engineering Hokkaido Unive
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Sato Shin-ichiro
Takasaki Adv. Radiation Res. Institute Jsea
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Park Ji-ho
Dept. Of Electronics & Information Eng. Toyohashi Univ. Of Tech.
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Okada Hiroshi
Intelligent Sensing System Research Center Toyohashi University Of Technology
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Park Ji-ho
Graduated School Of East-west Medical Sci. Kyung Hee Univ.
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Wakahara Akihiro
Dept. Of Electronic And Information Engineering Toyohashi Univ. Of Technology
著作論文
- Effect of Ion-Beam-Induced Damage on Luminescence Properties in Tb-Implanted Al_xGa_N
- Effect of Ion-Beam-Induced Damage on Luminescence Properties in Tb-Implanted Al_xGa_N