HOSOKAWA TOSHINORI | Design Technology Development Department, Semiconductor Technology Academic Research Center(STARC)

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概要

• 同名の論文著者
• Design Technology Development Department, Semiconductor Technology Academic Research Center(STARC)の論文著者

関連著者

• Date Hiroshi

  Starc

• MURAOKA Michiaki

  STARC

• MURAOKA Michiaki

  Design Technology Development Department, Semiconductor Technology Academic Research Center (STARC)

• HOSOKAWA TOSHINORI

  Design Technology Development Department, Semiconductor Technology Academic Research Center(STARC)

• DATE HIROSHI

  Design Technology Development Department, Semiconductor Technology Academic Research Center(STARC)

• Hosokawa T

  Starc

• Muraoka M

  Starc (semiconductor Technol. Academic Res. Center) Yokohama‐shi Jpn

著作論文

• A Test State Reduction Method for FSMs with Non-Scan DFT Using Don't Care Inputs Identification Technique (特集:システムLSIの設計技術と設計自動化)
• Two Test Generation Methods Using a Compacted Test Table and a Compacted Test Plan Table for RTL Data Path Circuits(Special Issue on Test and Verification of VLSI)

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