NOJIMA Reiko | Semiconductor DA & Test Center, TOSHIBA CORPORATION

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概要

• 同名の論文著者
• Semiconductor DA & Test Center, TOSHIBA CORPORATIONの論文著者

関連著者

• Goto N

  Ulsi Research Labolatories R & D Center Toshiba Corporation

• Yamada M

  Mitsubishi Electric Corp. Itami‐shi Jpn

• Tachibana Masayoshi

  Semiconductor Da & Test Center Toshiba Corporation

• Yamada Masaaki

  Semiconductor Da & Test Center Toshiba Corporation

• KUROSAWA Sachiko

  Semiconductor DA & Test Center, TOSHIBA CORPORATION

• NOJIMA Reiko

  Semiconductor DA & Test Center, TOSHIBA CORPORATION

• KOJIMA Naohito

  Semiconductor DA & Test Center, TOSHIBA CORPORATION

• MITSUHASHI Takashi

  Semiconductor DA & Test Center, TOSHIBA CORPORATION

• GOTO Nobuyuki

  ULSI Research Labolatories, R & D Center, TOSHIBA CORPORATION

• Nojima Reiko

  Semiconductor Da & Test Center Toshiba Corporation

• Kojima Naohito

  Semiconductor Da & Test Center Toshiba Corporation

• Yamada M

  Kanazawa Univ. Kanazawa‐shi Jpn

• Kurosawa Sachiko

  Semiconductor Da & Test Center Toshiba Corporation

• Mitsuhashi Takashi

  Semiconductor Da & Test Center Toshiba Corporation

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著作論文

• Power and Area Minimization by Reorganizing CMOS Complex-Gates (Special Section of Selected Papers from the 8th Karuizawa Workshop on Circuits and Systems)

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