YANG Beelyong | Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

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概要

• 同名の論文著者
• Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.の論文著者

関連著者

• Lee Seaung

  Feram Device Team Memory R&d Division Hynix Semiconductor

• Lee Seaung

  Memory Research and Development Division, Hynix Semiconductor Inc.

• Kang Nam

  Memory Research and Development Division, Hynix Semiconductor Inc.

• Kang Y

  Hynix Semiconductor Kyoungki‐do Kor

• Kang N

  Hynix Semiconductor Kyoungki‐do Kor

• Hwang Chi-sun

  Micro-electronics Tech. Lab. Electronics And Telecommunications Research Institute

• Lee Seaung

  Memory Research And Development Division Hyundai Electronics Industries Co. Ltd.

• KANG Young

  Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

• YANG Beelyong

  Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

• CHUNG Choong

  Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

• KYE Hun

  Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

• HONG Suk

  Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.

• Hong Suk-kyoung

  Semiconductor Advanced Research Division Hyundai Electronics Industries Co. Ltd.

• Hong Suk

  Memory Research And Development Division Hyundai Electronics Industries Co. Ltd.

• Kye Hun

  Memory Research And Development Division Hyundai Electronics Industries Co. Ltd.

• Hong S.-k.

  Feram Device Team Memory R&d Division Hynix Semiconductor

• Chung Choong

  Feram Device Team Memory R&d Division Hynix Semiconductor

• Yang B

  Feram Device Team Memory R&d Division Hynix Semiconductor

• Kang Y

  Feram Device Team Memory R&d Division Hynix Semiconductor

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著作論文

• Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi_2Ta_2O_9/Pt Capacitor(Special Issue on Nonvolatile Memories)

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