Aihara Ryuso | JEOL LTD.
スポンサーリンク
概要
関連著者
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Aihara Ryuso
JEOL LTD.
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Kim Pil
Riken The Institute Of Physical And Chemical Research
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Kim Pil
The Institute Of Physical And Chemical Research
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Namba Susumu
The Institute Of Physical And Chemical Research
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Namba S
Japan Atomic Energy Res. Inst. Kyoto Jpn
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Gamo Kenji
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Shiokawa Takao
The Institute of Physical and Chemical Research Wako
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Toyoda Koichi
The Institute of Physical and Chemical Research Wako
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Gamo Kenji
Osaka University, Faculty of Engineering Science
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Anazawa Norimichi
JEOL LTD.
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Yuba Yoshihiko
Department Of Physical Science Graduate School Of Engineering Science Osaka University
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Nihei Fumiyuki
Nec Corp
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Nonoyama Shinji
Quantum Material Research Laboratory Frontier Research Program The Institute Of Physical And Chemica
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Ochiai Yukinori
Nec Corp
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Kim P
Riken The Institute Of Physical And Chemical Research
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Yuba Yoshihiko
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Kasahara Haruo
Jeol Ltd
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Namba Susumu
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Miyake Hideo
Department Of Surgery Japanese Red Cross Nagoya First Hospital
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SAWARAGI Hiroshi
JEOL LTD
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MANABE Hironobu
JEOL LTD
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NAKAMURA Kazuo
NEC Corp
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MATSUI Shinji
JEOL LTD
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NOZAKI Tadatoshi
NEC Corp
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Namba S
Riken The Institute Of Physical And Chemical Research
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MIMURA Ryo
JEOL Ltd.
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Toyoda Koichi
The Institute Of Physical And Chemical Research
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Namba S
Faculty Of Engineering Osaka University
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Miyake Hideo
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Miyake Hideo
Department Of Electrical And Electronic Engineering Mie University
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Shiokawa Takao
The Institute of Physical and Chemical Research
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Sawaragi Hiroshi
JEOL LTD., 3-1-2 Musashino, Akishima, Tokyo 196, Japan
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Ochiai Yukinori
NEC Corp., 4-1-1 Miyazaki, Miyamae, Kawasaki 213, Japan
著作論文
- 200 kV Mass-Separated Fine Focused Ion Beam Apparatus
- Distribution Profiles and Annealing Characteristics of Defects in GaAs Induced by Low-Energy FIB Irradiation : Electrical Properties of Condensed Matter
- Performance of a Focused-Ion-Beam Implanter with Tilt-Writing Function