HUFF H. | International SEMATECH

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概要

• 同名の論文著者
• International SEMATECHの論文著者

関連著者

• HUFF H.

  International SEMATECH

• BERSUKER G.

  International SEMATECH

• BARNETT J.

  International SEMATECH

• MOUMEN N.

  International SEMATECH

• FORAN B.

  International SEMATECH

• YOUNG C.

  International SEMATECH

• LYSAGHT P.

  International SEMATECH

• PETERSON J.

  International SEMATECH

• LEE B.

  International SEMATECH

• ZEITZOFF P.

  International SEMATECH

• Lee B.

  Ibm Assignees

• Barnett J.

  Sematech

• Huff H.

  International Sematech Inc.

• Kwong D.

  University Of Texas At Austin

• Zeitzoff P.

  Sematech

• LUO T.

  University of Texas at Austin

• AL-SHAREEF H.

  International Sematech, Inc.

• KARAMCHETI A.

  International Sematech, Inc.

• WATT V.

  International Sematech, Inc.

• BROWN G.

  International Sematech, Inc.

• JACKSON M.

  International Sematech, Inc.

• EVANS B.

  Gasonics International

• Al-shareef H.

  International Sematech Inc.

• Karamcheti A.

  International Sematech Inc.

• Jackson M.

  International Sematech Inc.

• Lee B.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

• Zeitzoff P.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

• Bersuker G.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

• Moumen N.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

• Foran B.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

• Lysaght P.

  International SEMATECH, 2706 Montopolis Dr., Austin, TX, U.S.A.

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著作論文

• Interfacial Layer-Induced Mobility Degradation in High-k Transistors
• High Performance NMOS Devices Using Ultra-Thin VHP Oxynitride
• Interfacial Layer-Induced Mobility Degradation in High-$k$ Transistors

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