Amakawa Shuhei | School Of Engineering The University Of Tokyo

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概要

• 同名の論文著者
• School Of Engineering The University Of Tokyoの論文著者

関連著者

• Amakawa Shuhei

  School Of Engineering The University Of Tokyo

• Amakawa S

  School Of Engineering The University Of Tokyo

• Hoh Koichiro

  School Of Frontier Sciences The University Of Tokyo:crest Japan Science And Technology Corporation

• Hoh Koichiro

  Vlsi Design And Education Center The University Of Tokyo

• TSUBOKURA Takeshi

  School of Engineering, the University of Tokyo

• FUJISHIMA Minoru

  VLSI Design and Education Center, the University of Tokyo

• FUJISHIMA Minoru

  School of Engineering, The University of Tokyo

• TAJIMA Takuro

  School of Engineering, the University of Tokyo

• FUKUI Hironobu

  School of Engineering, The University of Tokyo

• Tajima Takuro

  School Of Engineering The University Of Tokyo

• Fukui Hirobumi

  Department Of Information And Communication Engineering The University Of Tokyo

• FIJISHIMA Minoru

  VLSI Design and Education Center, The University of Tokyo

• Fujishima M

  Vlsi Design And Education Center The University Of Tokyo

• Fujishima Minoru

  School Of Engineering The University Of Tokyo

• Fujishima M

  School Of Frontier Sciences The University Of Tokyo

• Fujishima M

  Department Of Frontier Informatics Graduate School Of Frontier Sciences The University Of Tokyo

• Amakawa Shuhei

  School of Engineering, the University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

• Tsubokura Takeshi

  School of Engineering, the University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

• Hoh Koichiro

  VLSI Design and Education Center, the University of Tokyo

• Hoh Koichiro

  School of Frontier Sciences, the University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

• Fujishima Minoru

  School of Frontier Sciences, the University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

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著作論文

• Charging and Retention Times in Silicon-Floating-Dot-Single-Electron Memory
• Proposal of a Schottky-Barrier SET Aiming at a Future Integrated Device (Special Issue on New Concept Device and Novel Architecture LSIs)
• Circuit Simulators Aiming at Single-Electron Integration
• Charging and Retention Times in Silicon-Floating-Dot-Single-Electron Memory

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