Park Sung | R&d Division Hynix Semiconductor Inc.

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Retention Time Analysis on DRAM Cell Transistor from Planar to Nonplanar Gate Structures(Session 4 Silicon Devices II,AWAD2006)
Retention Time Analysis on DRAM Cell Transistor from Planar to Nonplanar Gate Structures(Session 4 Silicon Devices II,AWAD2006)
Retention Time Analysis on DRAM Cell Transistor from Planar to Nonplanar Gate Structures
Novel threshold voltage fine control method for FETs within a wafer using LDSi (Locally Differentiated Scanning ion implant)

スポンサーリンク