Lin C‐l | Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University
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Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University | 論文
- Thickness and Stress Polarity Effects on the Reliability of the Low Thermal Budget Polyoixdes : Semiconductors
- Microcrystalline SiC Films Grown by Electron Cyclotron Resonance Chemical Vapor Deposition at Low Temperatures
- Reactively Sputtered Amorphous TaSi_xN_y Films Serving as Barrier Layer Against Copper Diffusion
- Chemically Vapor Deposited Cu Films on Ar-Plasma-Treated TiN Substrate(Surfaces, Interfaces, and Films)
- A New Method to Correct Capacitance of High-leakage Ultra-thin Gate Dielectric