Ahn Tae | On Leave From Semiconductor R&d Center Samsung Electronics Co. Ltd.
スポンサーリンク
概要
関連著者
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Nakamura Keiji
Department of Electrical Engineering, Nagoya University
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Sugai Hideo
Department of Electrical Engineering, Nagoya University
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Ahn Tae
On Leave From Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Sugai Hideo
Department Of Electrical Engineering School Of Engineering Nagoya Univeristy
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Nakamura Keiji
Department Of Electrical Electronics And Information Engineering Graduate School Of Engineering Osak
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Nakamura K
Department Of Electrical Engineering School Of Engineering Nagoya University
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Nakamura Keiji
Department Of Electrical Engineering Nagoya University
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Sugai Hideo
Department O Electrical Engineering Nagoya University
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Nakamura Keiji
Department Of Biology And Geosciences Graduate School Of Science Osaka City University:present Addre
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AHN Tae
Department of Electrical Engineering, Nagoya University
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安 太赫
on leave from semiconductor R&D Center, Samsung Electronics Co., Ltd.
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中村 圭二
Department of Electrical Engineering, Nagoya University
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菅井 秀郎
Department of Electrical Engineering, Nagoya University
著作論文
- Space- and Time-Resolved Measurements of Negative Ions in a Pulsed Inductively-Coupled Plasma in Chlorine
- A New Technology for Negative Ion Detection and the Rapid Electron Cooling in a Pulsed High-Density Etching Plasma