GABETTE L. | Philips
スポンサーリンク
概要
関連著者
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LOUBET N.
STMicroelectronics
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DENORME S.
STMicroelectronics
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LEVERD F.
STMicroelectronics
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GOURAUD P.
STMicroelectronics
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SKOTNICKI T.
STMicroelectronics
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LAVIRON C.
CEA-LETI
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BOEUF F.
STMicroelectronics
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FENOUILLET-BERANGER C.
CEA-LETI
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KORMANN T.
Philips Semiconductors
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TARNOWKA A.
Philips Semiconductors
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GALLON C.
STMicroelectronics
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BROEKAART M.
Philips
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IMBERT G.
STMicroelectronics
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CHATON C.
CEA-LETI
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GABETTE L.
Philips
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VIGILANT F.
Philips
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GARNIER P.
STMicroelectronics
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BERNARD H.
STMicroelectronics
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VANDOOREN A.
Freescale Semiconductors
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PANTEL R.
STMicroelectronics
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PIONNIER F.
STMicroelectronics
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JULLIAN S.
Philips
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KORMANN T.
NXP Semiconductors
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JULLIAN S.
NXP Semiconductors
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GARNIER P.
NXP Semiconductors
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LOUBET N.
ST Microelectronics
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SKOTNICKI T.
ST Microelectronics
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FIORI V
STMicroelectronics
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CRISTOLOVEANU S.
IMEP
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FENOUILLET-BERANGER C.
ST Microelectronics
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CRISTOLOVEANU S.
IMEP-INPG MINATEC
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Leverd F.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Fiori V.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Cristoloveanu S.
IMEP, 23 Av. des Martyrs, 38016 Grenoble, France
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Fiori V.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Loubet N.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Tarnowka A.
Philips, 850 rue Jean Monnet, 38921 Crolles, France
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Kormann T.
Philips, 850 rue Jean Monnet, 38921 Crolles, France
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Fenouillet-Beranger C.
CEA-LETI, 17 Av. des Martyrs, 38054 Grenoble, France
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Pantel R.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Imbert G.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Pionnier F.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Denorme S.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Gallon C.
STMicroelectronics, Central R&D, 850 rue Jean Monnet, 38921 Crolles, France
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Jullian S.
Philips, 850 rue Jean Monnet, 38921 Crolles, France
著作論文
- Effect of Process Induced Strain in 35nm FDSOI Devices with Ultra-Thin Silicon Channels
- Mechanical and Electrical Analysis of Strained Liner Effect in 35 nm Fully Depleted Silicon-on-Insulator Devices with Ultra Thin Silicon Channels