Yoo Cha | Semiconductor R&d Center Samsung Electronics Co. Ltd
スポンサーリンク
概要
関連著者
-
Lee Moon
Samsung Electronics Co. Semiconductor R&d Center Memory Process Development Team
-
Lee M
Samsung Electronics Co. Ltd. Kyungki‐do Kor
-
Yoo Cha
Semiconductor R&d Center Samsung Electronics Co. Ltd
-
Lee Moon
Semiconductor R&d Center Samsung Electronics Co. Ltd
-
Lee S
Samsung Electronics Co. Ltd. Kyungki‐do Kor
-
Lee Sang
Process Development Team Semiconductor R&d Center Samsung Electronics Co. Ltd
-
Lee Sang
Semiconductor R&d Center Samsung Electronics Co. Ltd.
-
Lee S
Samsung Electronics Co. Ltd. Kyungki Kor
-
Lee Moon
Semiconductor R&d Samsung Electronics Co. Ltd.
-
OH Sejun
Semiconductor R & D Center, Samsung Electronics Co., Ltd
-
Oh Sejun
Semiconductor R&d Center Samsung Electronics Co. Ltd
-
Lee S.I.
Semiconductor R&D Division, Samsung Electronics Co., Ltd.
-
Park I‐s
Storage Solution Team Dm R&d Center Samsung Electronics Co. Ltd.
-
Park I
Semiconductor R & D Center Samsung Electronics Co. Ltd
-
Park I
Samsung Electronics Co. Ltd. Kyungki‐do Kor
-
Moon J
Samsung Electronics Co. Ltd. Kyungki‐do Kor
-
Lee S
Kangwon National Univ. Kangwon‐do Kor
-
Lee S‐m
Seoul National Univ. Seoul Kor
-
Park In
Semiconductor R & D Center Samsung Electronics Co. Ltd
-
KOH Young
Semiconductor R&D Center, Samsung Electronics Co.Ltd.
-
KIM Byung
Semiconductor R & D Center, Samsung Electronics Co., Ltd
-
MOON Jong
Semiconductor R & D Center, Samsung Electronics Co., Ltd
-
Moon Jong
Semiconductor R & D Center Samsung Electronics Co. Ltd
-
Kim Byung
Semiconductor R & D Center Samsung Electronics Co. Ltd
-
Kim B.h.
Semiconductor R & D Center Samsung Electronics Co. Ltd
-
Koh Y
Semiconductor R&d Center Samsung Electronics Co.ltd.
-
Koh Young
Semiconductor R&d Center Samsung Electronics Co. Ltd.
-
KOH Young
Semiconductor R & D Center, Samsung Electronics Co., Ltd
著作論文
- Effect of SiO_2 Film Deposition on the Ferroelectric Properties of a Pt/Pb(Zr,Ti)O_3/Pt Capacitor
- Degradation and Recovery in the Ferroelectric Properties of Pt/Pb(Zr,Ti)O_3/Pt capacitor caused by SiO_2 Film Deposition
- Degradation and Recovery in the Ferroelectric Properties of Pt/Pb(Zr,Ti)O_3/Pt capacitor caused by SiO_2 Film Deposition