Kasahara Hajime | Department of Electronics, Faculty of Engineering, Kobe University
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- Department of Electronics, Faculty of Engineering, Kobe Universityの論文著者
Department of Electronics, Faculty of Engineering, Kobe University | 論文
- Raman Microprobe Study on Relaxation of Residual Stresses in Patterned Silicon-on-Sapphire
- Laser-Oscillating-Mode Dependence of Temperature Distributions in Laser Annealing of Semiconductors
- Relief of Residual Strain in Silicon-on-Sapphire by Heat-Assisted Pulsed-Laser Annealing
- Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering
- Factor(s) Protecting Pyruvate Orthophosphate Dikinase of Panicum maximum against Cold-Inactivation