FUJIWARA Hideo | Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)
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- Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)の論文著者
Graduate School of Information Science, Nara Institute of Science and Technology (NAIST) | 論文
- F-Scan: A DFT Method for Functional Scan at RTL
- F-Scan : A DFT Method for Functional Scan at RTL
- Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
- Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information
- Design for Two-Pattern Testability of Controller-Data Path Circuits