HASE Takashi | 論文著者

Department Of Electronics Faculty Of Engineering Kyoto University

Department of Electronics, Faculty of Engineering, Kyoto University

Department Of Oral And Maxillofacial Surgery Kanazawa University Graduate School Of Medical Science

Department of Oral and Maxillofacial Surgery, Kanazawa University Graduate School of Medical Science

Elsa Animal Hospital

Fundamental Research Laboratories Nec Corporation

Fundamental Research Laboratories, NEC Corporation

Fundamental Research Laboratories, NEC Corporation, 4-1-1 Miyazaki, Miyamae-ku, Kawasaki 216-8555, Japan

Fundamental Research Laboratories, NEC Corporation, 4–1–1 Miyamae–ku, Kawasaki 216, Japan

Fundamental Research Laboratories, NEC Corporation, 4–1–1 Miyazaki, Miyamae–ku, Kawasaki 216–8555, Japan

LSI Fundamental Research Laboratory, NEC Electronics Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan

LSI Research Laboratory, Renesas Electronics Corporation, 1120 Shimokuzawa, Chuo-ku, Sagamihara 252-5298, Japan

System Devices Research Laboratories Nec Corporation

System Devices Research Laboratories, NEC Corporation

System Devices Research Laboratories, NEC Corporation, 1120 Shimokuzawa, Sagamihara, Kanagawa 229-1198, Japan

Ulsi Device Development Division Nec Electron Devices Nec Corporation

ULSI Device Development Division, NEC Electron Devices, NEC Corporation