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表面分析研究会 | 論文
- Oxygen enhanced surface roughening of Si(111) induced by low energy Xe[+] ion sputtering (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Core level and Auger line shifts in CoPt alloys
- Common Data Processing System Version 7
- Common data processing system for ISO standards: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- A Comparative Study of GDOES, SIMS and XPS Depth Profiling of Thin Layers on Metallic Materials
- Influence of Ion Beam Position Shift on the Depth Profiling in AES
- Accurate Density Functional Calculation of Core XPS Spectra:Towards an Evidencing of Intermolecular Effects at Real Interfaces via XPS?
- EPMAによる多孔質試料および粉末試料の定量の検討
- 講義 オージェ電子分光法による深さ方向分析
- 話題 平均マトリックス感度係数による表面定量分析
- 関根哲氏をしのぶ
- 信号の脱出過程の基礎 (特集:VAMAS-SCA Japan復刻版(1989,1994)) -- (実用電子分光法講座(1994年1月))
- 表面電子分光法における信号の減衰は如何に記述されるか?(1)概要
- 表面電子分光法における信号の減衰は如何に記述されるか?(2)誘電関数とIMFP
- 講義 表面電子分光法における信号の減衰は如何に記述されるか?(3)XPSおよびAESによる表面定量分析法
- A Practical Procedure for Surface Protection of a Bulk Specimen in the Air
- X-Ray Photoelectron and Carbon Kα Emission Spectral Analysis of Polymers by DFT Calculations using QM/MM Method
- Temperature Dependence of Band Alignment in Ultra-thin HfO2/Si Interface
- Extremely smooth surface etching by giant cluster ion impact (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Depth profiling of polystyrene using charged water droplet impact (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))