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表面分析研究会 | 論文
- Current activities of SC4 depth profiling in ISO/TC201 Surface Chemical Analysis (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Development of Fine-Pitch Four-Point Probe for High Spatial Resolution Sheet Resistance Measurement
- Ghost Spectra and Rubbish Electrons in a CMA
- Dissociation reaction of (CH3)2S adsorbed on Pd nanoparticles fabricated by gas evaporation method (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- AES and XPS analysis of nanowear and thin films (Proceedings of the International Symposium on New Trends and Possibilities of Surface Analysis--Towards the Analysis of Nano-structured Materials)
- Quantitative Analysis of AlxGa1-xN Thin Films by XPS (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- C1s CEBEs of Hydrocarbons on Elemental Oxides(1)MO Calculations using CH4 Model Molecules
- Synthesis and Structure of Polymer/Metal Interfaces:a Convergence of Views between Theory and Experiment
- 信号の発生(励起過程)の基礎 (特集:VAMAS-SCA Japan復刻版(1989,1994)) -- (実用電子分光法講座(1994年1月))
- Spectroscopic study on the adsorption reaction of L-Cysteine on Cu nanoparticle/Ag under in vivo condition (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysi
- Redistribution Behavior of Trace Elements during Interal Oxidation of an Fe-6mol%Si Alloy at 1123K
- Nickel Enrichment at the Interface between Oxide Layer and Matrix in Iron-Nickel Alloys
- Boron and Oxygen Redistribution during Silicidation Process of Titanium-Silicon System
- Performance analysis of algorithms to find peaks in AES and XPS spectra (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Problems Caused by Ion Sputtering for the Mesh-Replica Method and Caution in Measuring Sputtered Surface Profiles
- Intrinsic Excitations in Deep Core Auger and Photoelectron Spectra of Ge and Si
- Spectral Analysis of XPS of Diamond and Graphite by MO Calculations using Model Molecules
- Alternation of Ti 2p XPS Spectrun for TiO2 by Ar Ion Bombardment
- Change of Ti2p XPS spectrum for Titanium Oxide by Ar Ion Bombardment
- Evaluation of the Ni diffusion to the surface of Au plating for soldering process control