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表面分析研究会 | 論文
- Refefence Materials Used in My Laboratory
- Ion beam alignment procedures using a faraday cup or a silicon dioxide film on silicon substrate with auger electron microscope
- Cross-sectional analysis of the Interface between Sn-Ag-Cu solder alloy and Substrate by using angle lapping Method
- Transmission measurement of the absolute CMA: simulation and experiments
- Legacy of Tetsu Sekine in AES
- Adsorption Behavior of (CH3)2S on Rh(100) Studied by Sulfur K-Edge NEXAFS and XPS
- Coadsorption behavior of (CH3)2S with H2O or D2O on Rh(100) studied by XPS and NEXAFS (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Change of Energy Distribution of He+ Induced Electrons from MgO Thin Film with Ion Irradiation
- Development of Unique Specimen Holder for LEED-AES Study at High Temperatures
- Evaluation of Solder Composition by Surface Analysis
- Identification of background in CMA
- The standard Auger electron spectra in the AIST DIO-DB(111);Ge(111) (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- Sputtering, cluster primary ions and static SIMS: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Coverage Estimation of Silane Functionalized Perfluoropolyether Layer by using Time of Flight Secondary Ion Mass Spectrometry, Atomic Force Microscopy and Ion Scattering Spectroscopy
- Technical Report Imaging of Defects in IIa Diamond by Cathodoluminescence Field Emission Scanning Electron Microscope
- Effect of Surface Orientation on Surface Composition in a Polycrysttalline Fe-Cr-Ni Alloy
- Interface potential measurement with electron spectroscopic method (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- Estimation of inelastic mean free paths in Au and Cu from their elastic peak intensity ratios without IMFP values of reference material in the 200-5000 eV energy range (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- High-Energy Resolution Microcalorimeter EDS System for Electron Beam Excitation
- Quadrupole SIMS analysis of Si concentration in GaN layers by a molecular ion detection with a minor isotope (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analy