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表面分析研究会 | 論文
- Surface Characterization of Organic Electroluminescent Thin Film Materials
- 深さ方向情報を得る--オージェデプスプロファイルの定量的な解析方法について
- 講義 Tougaardの非弾性散乱計算の実際
- Lateral Resolution of EDX Analysis with Ultra Low Acceleration Voltage SEM
- Quantification of Surface Effects in Electron Spectroscopy
- On the energy distribution of secondary electrons emitted from metals (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- Characterization and optimization of a polyatomic ion source for organic depth profiling (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Plasma Modification of Biomaterials Controlled by Surface Analysis
- オージェ電子分光法における背面散乱補正(1)広い分析条件で使用可能な電子の背面散乱補正式の開発
- Investigation of Mesh Opening Size in Mesh-Replica Method Toward Standardization of Depth Profiling Technique
- Simulation of Thermal Decomposition for Polymer Molecules
- Practical methods for detecting peaks in auger electron spectroscopy and x-ray photoelectron spectroscopy
- Influence of Tilt Angle on Peak profile in AES Measurement of Insulator
- Monte Carlo study of depth distribution function of secondary electrons (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Invited paper: Simulation study of electron scattering in crystalline solid by using Bohmian quantum trajectory method (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on sur
- In-situ observation of the reaction between iron and carbon in TEM (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Development of Ultra High Vacuum Transmission Electron Microscope for In Situ Observation of Silicides And Island Formation on Silicon Surface at High Temperatures by Reflection And Transmission Electron Microscope
- Effects of carbon contaminations on electron-induced damage of SiO2 film surface at different electron primary energies
- Investigation of measurement conditions of metastable de-excitation spectroscopy of MgO thin films used for plasma display panels
- Nondestructive depth resolved analysis by using grazing exit fluorescence-yield X-ray absorption spectroscopy (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))