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表面分析研究会 | 論文
- XPS Analysis and Solder Wettability of Sn-Cu and Sn-Pb Platings Accelerated by Various Methods
- X-Ray Photoelectron Spectral Analysis for Carbon Allotropes,
- Database construction of secondary electron emission: Monte Carlo approach combined with supplementary experiment: special lecture, Korea-Japan symposium (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007,
- Formulation for XPS Spectral Change of oxides by Ar Ion Bombardment: Application of the formulation to Ta2O5 System (特集 酸化物表面分析における最近の展開)
- Lateral resolution of EDX analysis with low acceleration voltage SEM (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Correction of Work Functions for the Absolute Auger Electron Spectroscopy: Experimental Evidence and PC Simulation
- Characterization of Micro-Corrosion on Magnetic Recording Disks by ToF-SIMS and AAS
- 化学試験を例としたISO/IEC17025試験所認定取得の実際(方法,意義,運営) (第38回表面分析研究会講演資料)
- Relativistic spin-polarized X-ray photoelectron diffraction theory from heavy elements (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Influences of measurement conditions on etching rate of GaAs/AlAs superlattice in Auger electron spectroscopy sputter depth profiling (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Analysis of UV-Visible Absorption Spectra for Quartz and Topaz in Silicate Minerals by MO Calculations Using the Cluster Model Molecules
- Simulation and Quantitative Interpretation of Electron Spectra for Surface Analysis
- Electronic structure in the bulk of titanium hydrides fractured in ultrahigh vacuum by XPS surface analysis (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Charging Effect in Gold Nanoclusters Grown on Octanedithiol Self-assembled Monolayers Observed by Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy
- Spectrum processing for quantitative Auger electron spectroscopy (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- 掲示板 PSA-11におけるToF-SIMS WG活動
- My Footprints on the Field of Practical Surface Analysis (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- A Method of Evaluating Sample Damage in XPS using Nitrocellulose as a Standard for Organic Materials
- 話題 タイム・カプセル EXPO'70の開封
- 掲示板 XPSワーキンググループ活動報告 : イオンスパッタ後表面の化学状態分析
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