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表面分析研究会 | 論文
- Evaluation of focused ion beam for shave-off depth profiling (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)
- Analysis of XPS and AES of Carbon Allotrope(Diamond, Graphite, C60) by DFT Calculations Using the Model Molecules
- Photoelectron spectrometer equipped with open counter for electronic structures of organic materials (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Getting more from XPS imaging: multivariate analysis for spectromicroscopy
- Surface characterization in biomaterials applications: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Practical Characterization of Surface and Interface Phenomena in Iron and Steel
- Theory of high-energy photoemission: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Application of lubricants structure on ophthalmic lens (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)
- Analysis of Auger Depth Profiles by Logistic Function
- Determination of Escherichia coli Negative Charge Concentration From XPS Data and Its Variation with pH
- XPS: issues with data acquisition and data processing: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Surface Spectroscopy Utilizing Field Electron Emission fron Thermal-field Treated Tips in STM
- 深さ方向分析 (解説 ISO/TC201表面化学分析の現状と動向)
- Evaluation of SIMS depth resolution with Delta Multi-layer Reference Materials
- Electron backscattering in sputter depth profiling using AES, EPES, and REELS (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- Changes in the Chemical State and Composition of the Surface of Iron Oxides due to Argon Ion Sputtering
- Grazing Incidence X-Ray Photoelectron Spectroscopy: A Method to Study Gate Dielectric Films on Si
- Chemical Shift at Interface for Silicides
- The NIST Electron Effective-Attenuatin-length Database
- A Round Robin Test on XPS Transmission Function
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