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表面分析研究会 | 論文
- New Developments in Depth Profiling Using AES
- Structural Analysis of (AXA')+ Ion in Gas Phase by ab initio MO Calculations
- Theoretical Analysis of Photocatalytic Interaction Between TiO2 Cluster and H2O
- EPMA装置開発の動向と展望 (特集 EPMAの最近の展開)
- Application of Self-Organising Maps(SOM) to Chemical Spectra Analysis
- Surface analysis of biomolecules: unravelling biointerfacial interactions: invited (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Optimization of XPS Inelastic Background using Tougaard's Formula-Recent Progress
- A background subtraction program for photo- and Auger electron spectra (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Results of inter-laboratory tests among SASJ on accurate mass scale calibration of ToF-SIMS (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)
- Depth profiling analysis of organic materials by using ToF-SIMS and gradient shaving preparation (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- 解説 工業材料評価におけるXPS局所分析
- Inelastic scattering cross section of Si determined from angular dependent reflection electron energy loss spectra (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- 走査型プローブ顕微鏡のステージ改良と制御方法
- Investigation of Hydrophobic Properties of PSII-modified EVOH, LLDPE, and PET Films
- Studies of Polystyrenes Using Time-of-Flight Secondary Ion Mass Spectrometry
- ISO/TC202におけるEPMA分析に関する標準化の現状 (特集 EPMAの最近の展開)
- Surface Analysis of Impact Compressed Cu-Ni Multilayer
- Fermi Level Movement at the Transition Metal/GaN Interface
- EPMAによる微小部状態分析
- Quantiative AES and XPS: Tests of Theory Using AES and XPS Databases with REELS Background Subtraction