Inelastic scattering cross section of Si determined from angular dependent reflection electron energy loss spectra (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
スポンサーリンク
概要
著者
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IWAI Hideo
National Institute for Materials Science
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YOSHIKAWA Hideki
National Institute for Materials Science
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Yoshikawa Hideki
National Institute For Materials Science Spring-8
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Iwai Hideo
National Institute For Materials Science (nims)
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Yokoyama Hisayuki
Department Of Hematology And Rheumatology Tohoku University Graduate School Of Medicine
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Yoshikawa Hideki
Japan Atomic Energy Agency
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