Performance Analysis of Gamma-Ray-Irradiated Color Complementary Metal Oxide Semiconductor Digital Image Sensors

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-04-15

著者

• Meng Xiang-ti

  Institute Of Nuclear Energy Technology Tsinghua University

• KANG Ai-Guo

  Institute of Nuclear Energy Technology, Tsinghua University

• LIU Jing-Quan

  Institute of Nuclear Energy Technology, Tsinghua University

• YOU Zheng

  Center of Aerospace Technology Research, Tsinghua University

• Liu Jing-quan

  Institute Of Nuclear Energy Technology Tsinghua University

関連論文

• Hydrogen-Defect Shallow Donors in Si
• Performance Analysis of Gamma-Ray-Irradiated Color Complementary Metal Oxide Semiconductor Digital Image Sensors
• Degradation of Black and White Complementary Metal Oxide Semiconductor (CMOS) Digital Image Sensor by Gamma-Irradiation : Semiconductors
• Performance Analysis of Gamma-Ray-Irradiated Color Complementary Metal Oxide Semiconductor Digital Image Sensors
• Hydrogen-Defect Shallow Donors in Si

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