Degradation of Black and White Complementary Metal Oxide Semiconductor (CMOS) Digital Image Sensor by Gamma-Irradiation : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-08-15
著者
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Meng X‐t
Tsinghua Univ. Beijing Chn
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Meng Xiang-ti
Institute Of Nuclear Energy Technology Tsinghua University
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KANG Ai-Guo
Institute of Nuclear Energy Technology, Tsinghua University
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YOU Zheng
Center of Aerospace Technology Research, Tsinghua University
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You Zheng
Center Of Aerospace Technology Research Tsinghua University
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Kang A‐g
Institute Of Nuclear Energy Technology Tsinghua University
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Kang Ai-guo
Institute Of Nuclear Energy Technology Tsinghua University
関連論文
- Hydrogen-Defect Shallow Donors in Si
- Performance Analysis of Gamma-Ray-Irradiated Color Complementary Metal Oxide Semiconductor Digital Image Sensors
- Degradation of Black and White Complementary Metal Oxide Semiconductor (CMOS) Digital Image Sensor by Gamma-Irradiation : Semiconductors
- Performance Analysis of Gamma-Ray-Irradiated Color Complementary Metal Oxide Semiconductor Digital Image Sensors
- Hydrogen-Defect Shallow Donors in Si