A spherical aberration-corrected 200kV TEM

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概要

• 論文の詳細を見る
• 2003-02-01

著者

• NARUSE Mikio

  JEOL Ltd.,

• Haider Max

  Ceos Gmbh

• TOMITA Takeshi

  JEOL Ltd.

• HONDA Toshikazu

  JEOL Ltd.

• Tomita Takeshi

  Jeol Ltd

• HOSOKAWA Fumio

  JEOL Ltd

• Naruse Mikio

  Jeol Ltd

• HARTEL Peter

  CEOS GmbH

• Honda Toshikazu

  Jeol Ltd

関連論文

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• Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy : Surface, Interfaces, and Films
• Experimental evaluation of a spherical aberration-corrected TEM and STEM
• A spherical aberration-corrected 200kV TEM
• Measurement of electric potential distributions around FEG-emitters by electron holography
• A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope

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