A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1999-12-01

著者

• Urban Knut

  Institute Fur Festkorperforschung Forschungszentrum Julich Gmbh

• Haider Maximilian

  Ceos Gmbh

• Haider Max

  Ceos Gmbh

• Rose Harald

  Institut Fur Angewandte Physik

• KABIUS Bernd

  Institute fur Festkorperforschung, Forschungszentrum Julich GmbH

• Kabius Bernd

  Institute Fur Festkorperforschung Forschungszentrum Julich Gmbh

関連論文

• Experimental evaluation of a spherical aberration-corrected TEM and STEM
• A spherical aberration-corrected 200kV TEM
• Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part II)
• A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope
• Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
• Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (Part I)

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