Naruse Mikio | Jeol Ltd
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概要
関連著者
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NARUSE Mikio
JEOL Ltd.,
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Naruse Mikio
Jeol Ltd
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TOMITA Takeshi
JEOL Ltd.
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HONDA Toshikazu
JEOL Ltd.
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Tomita Takeshi
Jeol Ltd
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HARTEL Peter
CEOS GmbH
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Honda Toshikazu
Jeol Ltd
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GOLBERG Dmitri
物質・材料研究機構
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Golberg D
National Inst. Materials Sci. Ibraki Jpn
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Golberg D
物質・材料研究機構物質研究所
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Golberg Dmitri
Advanced Materials Laboratory National Institute For Materials Science
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Golberg Dmitri
National Institute For Materials Science
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Golberg Dmitri
物質・材料研究機構物質研究所
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Enomoto Yuji
Mechanical Engineering Laboratory
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Bando Y
National Inst. Materials Sci. (nims) Tsukuba Jpn
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Bando Y
Advanced Materials Laboratory National Institute For Materials Science (nims)
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Bando Y
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Bando Yoshio
Department Of Electrical Engineering Kure National College Of Technology
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Bando Yoshio
National Institute Of Materials Science
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Kizuka T
Univ. Tsukuba. Tsukuba Jpn
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Kizuka Tokushi
School Of Engineering Nagoya University
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Golberg Dmitri
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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KURASHIMA Keiji
National Institute for Research in Inorganic Materials
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Bando Y
National Inst. Materials Sci. Ibaraki Jpn
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Bando Y
National Inst. Res. Inorganic Materials Tsukuba Jpn
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Bando Y
National Inst. Research In Inorganic Materials Ibaraki
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Sawada Hidetaka
Jeol Ltd.
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Sawada Hidetaka
Jeol Ltd
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Mitome Masanori
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Fujisawa Satoru
Mechanical Engineering Laboratory
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BANDO Yoshio
Advanced Materials Laboratory, National Institute for Materials Science
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KURASHIMA Keiji
Advanced Materials Laboratory and Nanomaterials Laboratory, National Institute for Materials Science
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KITAMI Yoshizo
Advanced Materials Laboratory, National Institute for Materials Science (NIMS)
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KANEYAMA Toshihiko
JEOL Ltd.,
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OKURA Yoshihiro
JEOL Ltd.,
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Yabe Akira
Mechanical Engineering Laboratory
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Haider Maximilian
Ceos Gmbh
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Haider Max
Ceos Gmbh
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Hetherington Crispin
Department Of Materials University Of Oxford
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Kirkland Angus
Department Of Chemistry University Of Cambridge
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Kirkland Angus
Department Of Materials University Of Oxford
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Sasaki S
Tohoku Electric Power Co. Inc.
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Titchmarsh John
Department Of Materials University Of Oxford
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Kitami Y
National Institute For Materials Science
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Kitami Yoshizo
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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HOSOKAWA Fumio
JEOL Ltd
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OHMI Hiromasa
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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OHMI Hajime
School of Engineering, Nagoya University
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SUMI Takao
School of Engineering, Nagoya University
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KUMAZAWA Katsuyoshi
School of Engineering, Nagoya University
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DEGUCHI Shunji
JEOL Ltd.
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SASAKI Shinya
Mechanical Engineering Laboratory
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Naruse M
Jeol Ltd.
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Naruse Mikio
Jeol Ltd.
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Bando Yoshio
International Center For Materials Nanoarchitectonics National Institute For Materials Science (nims
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Sumi Takao
School Of Engineering Nagoya University
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Ohmi Hajime
School Of Engineering Nagoya University
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Kurashima K
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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HAMBRIDGE Paul
JEOL Ltd
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DOOLE Ron
Department of Materials, University of Oxford
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HUTCHISON John
Department of Materials, University of Oxford
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COCKAYNE David
Department of Materials, University of Oxford
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Doole Ron
Department Of Materials University Of Oxford
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Cockayne David
Department Of Materials University Of Oxford
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Hutchison John
Department Of Materials University Of Oxford
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Bando Yoshio
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Kumazawa Katsuyoshi
School Of Engineering Nagoya University
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Takemura K
Jeol Ltd.
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Okura Yoshihiro
Jeol Ltd.
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Kurashima Keiji
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Tomita Takeshi
Jeol Ltd. Tokyo Jpn
著作論文
- New 300kV Energy-Filtering Field Emission Electron Microscope : Instrumentation, Measurement, and Fabrication Technology
- Simultaneous Observation of Millisecond Dynamics in Atomistic Structure, Force and Conductance on the Basis of Transmission Electron Microscopy : Surface, Interfaces, and Films
- Experimental evaluation of a spherical aberration-corrected TEM and STEM
- A spherical aberration-corrected 200kV TEM