Doole Ron | Department Of Materials University Of Oxford

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概要

• Doole Ron Cの詳細を見る
• 同名の論文著者
• Department Of Materials University Of Oxfordの論文著者

関連著者

• Doole Ron

  Department Of Materials University Of Oxford

• DOOLE Ron

  Department of Materials, University of Oxford

• PETFORD-LONG Amanda

  Department of Materials, University of Oxford

• Petford-long Amanda

  Department Of Materials University Of Oxford

• MIYAZAKI Terunobu

  Department of Applied Physics, Graduate School of Engineering, Tohoku University

• Sawada Hidetaka

  Jeol Ltd.

• Sawada Hidetaka

  Jeol Ltd

• Miyazaki Terunobu

  Department Of Applied Physics Faculty Of Engineering Tohoku University

• NARUSE Mikio

  JEOL Ltd.,

• Haider Maximilian

  Ceos Gmbh

• Yu Andrew

  Department Of Applied Physics Graduate School Of Engineering Tohoku University:department Of Materia

• Yu Andrew

  Department Of Applied Physics Graduate School Of Engineering Tohoku University

• Hetherington Crispin

  Department Of Materials University Of Oxford

• Kirkland Angus

  Department Of Chemistry University Of Cambridge

• Kirkland Angus

  Department Of Materials University Of Oxford

• TOMITA Takeshi

  JEOL Ltd.

• HONDA Toshikazu

  JEOL Ltd.

• Titchmarsh John

  Department Of Materials University Of Oxford

• Tomita Takeshi

  Jeol Ltd

• Naruse Mikio

  Jeol Ltd

• HAMBRIDGE Paul

  JEOL Ltd

• HARTEL Peter

  CEOS GmbH

• HUTCHISON John

  Department of Materials, University of Oxford

• COCKAYNE David

  Department of Materials, University of Oxford

• Miyazaki T

  Department Of Applied Physics Graduate School Of Engineering Tohoku University

• Cockayne David

  Department Of Materials University Of Oxford

• Hutchison John

  Department Of Materials University Of Oxford

• Honda Toshikazu

  Jeol Ltd

• HOSOMI Masanori

  Department of Materials, University of Oxford

• Hosomi M

  Department Of Materials University Of Oxford

• Petford‐long A

  Department Of Materials University Of Oxford

• Tomita Takeshi

  Jeol Ltd. Tokyo Jpn

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著作論文

• Experimental evaluation of a spherical aberration-corrected TEM and STEM
• Lorentz Microscopy Observation of Magnetic Domain Structure Variation in NiFe/Au Multilayer Films Caused by Au Layer Thickness
• High Resolution Electron Microscopy Observation of Different Al-Oxide Layers in Magnetic Tunnel Junctions : Surfaces, Interfaces, and Films

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