Lorentz Microscopy Observation of Magnetic Domain Structure Variation in NiFe/Au Multilayer Films Caused by Au Layer Thickness

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概要

• 論文の詳細を見る
• Japan Institute of Metalsの論文
• 1999-09-20

著者

• DOOLE Ron

  Department of Materials, University of Oxford

• Doole Ron

  Department Of Materials University Of Oxford

• HOSOMI Masanori

  Department of Materials, University of Oxford

• PETFORD-LONG Amanda

  Department of Materials, University of Oxford

• Hosomi M

  Department Of Materials University Of Oxford

• Petford-long Amanda

  Department Of Materials University Of Oxford

• Petford‐long A

  Department Of Materials University Of Oxford

関連論文

• Experimental evaluation of a spherical aberration-corrected TEM and STEM
• Lorentz Microscopy Observation of Magnetic Domain Structure Variation in NiFe/Au Multilayer Films Caused by Au Layer Thickness
• High Resolution Electron Microscopy Observation of Different Al-Oxide Layers in Magnetic Tunnel Junctions : Surfaces, Interfaces, and Films
• Direct Observation of Domain Structure and Magnetization Reversal of Magnetic Thin Films Using Lorentz Transmission Electron Microscopy : Magnetism
• TEM observation of the microstructure in sputtered NiFe/Au multilayer films

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