TEM observation of the microstructure in sputtered NiFe/Au multilayer films

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1999-12-01

著者

• Hosomi Masanori

  Electronics Engineering Laboratories Sumitomo Metal Industries Ltd

• Petford-long Amanda

  Department Of Materials University Of Oxford

関連論文

• Lorentz Microscopy Observation of Magnetic Domain Structure Variation in NiFe/Au Multilayer Films Caused by Au Layer Thickness
• High Resolution Electron Microscopy Observation of Different Al-Oxide Layers in Magnetic Tunnel Junctions : Surfaces, Interfaces, and Films
• Direct Observation of Domain Structure and Magnetization Reversal of Magnetic Thin Films Using Lorentz Transmission Electron Microscopy : Magnetism
• TEM observation of the microstructure in sputtered NiFe/Au multilayer films

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