Analysis of Acoustic Domain Fluxes in a Piezoelectric Semiconductor n-CdS Measured by Brillouin Scattering Method
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概要
- 論文の詳細を見る
- 2003-01-01
著者
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Tokunaga Yoshiaki
Optoelectronic Device System RD Center, Kanazawa Institute of Technology
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Okayama Toshinori
Graduate School Of Electrical Engineering And Electronics Of Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System Research And Development Center Of Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Odes R&d Center Of Kanazawa Institute Of Technology
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Kanno Shohei
Graduate School Of Electrical Engineering And Electronics Of Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronics Device System Research And Development Center Kanazawa Institute Of Technology
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