New technique for the formation of a three-dimension high-speed imaging of the subsurface crack of the opaque material measured by photoacoustic microscope
スポンサーリンク
概要
著者
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TAMURA Keimei
Department of Electrical Engineering, Kanazawa Technical College
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Tamura Keimei
Department Of Electrical Engineering Kanazawa Technical College
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Okayama Toshinori
Graduate School of Engineering, Kanazawa Institute of Technology
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Kato Kyoko
Graduate School of Engineering, Kanazawa Institute of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System RD Center, Kanazawa Institute of Technology
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Okayama Toshinori
Graduate School Of Electrical Engineering And Electronics Of Kanazawa Institute Of Technology
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Okayama Toshinori
Graduate School Of Engineering Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System Research And Development Center Of Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Odes R&d Center Of Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronic Device System R & D Center Kanazawa Institute Of Technology
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Kato Kyoko
Graduate School Of Engineering Kanazawa Institute Of Technology
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Tokunaga Yoshiaki
Optoelectronics Device System Research And Development Center Kanazawa Institute Of Technology
関連論文
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- New technique for the formation of a three-dimension high-speed imaging of the subsurface crack of the opaque material measured by photoacoustic microscope
- Study of New Technique for Three Dimensional Images in Photoacoustic Microscope
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- Photodarkening Effect of Amorphous Chalcogenide Thin Films Induced by Acoustic Domain : Physical Acoustics
- Study of Photoacoustic Three-Dimensional Imaging by the Simultaneous Measurement of Multiple Frequencies Method
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