Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Tada Hirokazu
Division Of Materials Physics Graduate School Of Engineering Science Osaka University
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Mishima Ryota
Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan
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Loan Ngyuen
Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan
関連論文
- Patterning of Organic Semiconductors on Silicon Oxide Using an Atomic Force Microscope with an Alternating-Current Electric Field
- Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy