Evaluation of joined silicon nitride by X-ray computed tomography (X-ray CT)
スポンサーリンク
概要
著者
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Kondo Naoki
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Tec
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Nishimura Yoshihiro
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Tec
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Suzuki Takayuki
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Tec
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KITA Hideki
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Tec
関連論文
- Evaluation of joined silicon nitride by X-ray computed tomography (X-ray CT)
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- Evaluation of joined silicon nitride by X-ray computed tomography (X-ray CT)
- Effect of Yb_2O_3 Addition on Si_3N_4-Lu_2O_3-SiO_2 Ceramics(Guest Editors Dedicated to Prof. Gunter Petzow: Modern Trends in Advanced Ceramics)
- Joining of silicon nitride with silicon slurry via reaction bonding and post sintering
- Fabrication of Thick Silicon Nitride by Reaction Bonding and Post-Sintering