Compact current modeling of fully depleted symmetric double-gate metal-oxide-semiconductor field effect transistors with doped short-channel

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Choi Byung‐kil

  Kyungpook National Univ. Daegu Kor

関連論文

• Analytic oxide capacitance model of double- and surrounding-gate metal-oxide-semiconductor field-effect transistors in linear region by considering inversion-layer capacitance
• Compact current modeling of fully depleted symmetric double-gate metal-oxide-semiconductor field effect transistors with doped short-channel
• Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor

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