Device isolation by plasma treatment for planar integration of enhancement/depletion-mode AlGaN/GaN high electron mobility transistors (Special issue: Solid state devices and materials)
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Tang Wilson
Department Of Electronic And Computer Engineering Hong Kong University Of Science And Technology
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Wang Ruonan
Department Of Electronic And Computer Engineering Hong Kong University Of Science And Technology
関連論文
- Device Isolation by Plasma Treatment for Planar Integration of E/D-mode AlGaN/GaN HEMTs
- Gain Improvement of Enhancement-mode AlGaN/GaN HEMTs Using Dual-Gate Architectures
- Gain improvement of enhancement-mode AlGaN/GaN high-electron-mobility transistors using dual-gate architecture (Special issue: Solid state devices and materials)
- Device isolation by plasma treatment for planar integration of enhancement/depletion-mode AlGaN/GaN high electron mobility transistors (Special issue: Solid state devices and materials)