Characterization of Novel Polycrystalline Silicon Thin-Film Transistors with Long and Narrow Grains

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Nakazaki Yoshiaki

  Advanced Lcd Technology Development Center Co. Ltd.

関連論文

• Characterization of High-Performance Polycrystalline Silicon Complementary Metal-Oxide-Semiconductor Circuits
• Characterization of Novel Polycrystalline Silicon Thin-Film Transistors with Long and Narrow Grains
• Characterization of Novel Polycrystalline Silicon Thin-Film Transistors with Long and Narrow Grains

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