Near-Edge X-Ray Absorption Fine Structure Study of Vertically Aligned Carbon Nanotubes Grown by the Surface Decomposition of SiC
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概要
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Vertically aligned carbon nanotubes (CNTs) grown by the surface decomposition of SiC were studied by angular-dependent C K-edge near-edge X-ray absorption fine structure spectroscopy (NEXAFS) with a linearly polarized X-ray beam. The NEXAFS spectra measured in total electron yield mode showed a distinct angular dependence on \pi^{*} and \sigma^{*} resonances and the orientation parameter was tentatively estimated to be 0.38, which is fairly larger than those reported for other vertically aligned CNTs grown by chemical vapor deposition. The high order of the vertical alignment of CNTs grown by the surface decomposition of SiC was demonstrated by NEXAFS measurements for the first time.
- 2012-05-25
著者
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Maruyama Takahiro
Department Of Chemistry Faculty Of Science Kyoto University
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AMEMIYA Kenta
Photon Factory and Condensed Matter Research Center, Institute of Materials Structure Science, High Energy Accelerator Research Organization
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Maruyama Takahiro
Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan
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Ishiguro Yuki
Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan
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Nartitsuka Shigeya
Department of Materials Science and Engineering, Meijo University, Nagoya 468-8502, Japan
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Norimatsu Wataru
Eco Topia Science Institute, Nagoya University, Nagoya 464-8603, Japan
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Kusunoki Michiko
Eco Topia Science Institute, Nagoya University, Nagoya 464-8603, Japan
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Ishii Hideshi
SR Center, Ritsumeikan University, Kusatsu, Shiga 525-8577, Japan
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Ohta Toshiaki
SR Center, Ritsumeikan University, Kusatsu, Shiga 525-8577, Japan
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Amemiya Kenta
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-PF), Tsukuba, Ibaraki 305-0801, Japan
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