Stress in Switchable Mirror Thin Film Resulting from Gasochromic Switching
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概要
- 論文の詳細を見る
To enable the practical use of the switchable mirror thin film, an improvement of switching durability is crucial. One of the causes of film degradation is the modification of the Pd cap layer in accordance with the volume change upon hydrogenation and dehydrogenation, which is expected to be related to inner stress in switchable mirror thin films. In this study, we observed stress change in the switchable mirror thin film resulting from gasochromic switching and investigated the relationship between stress and switching durability. We found that the inner stress of the Pd layer is directly related to the switching durability of switchable mirror thin films.
- 2010-07-25
著者
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Okada Masahisa
Material Res. Inst. For Sustainable Dev. National Inst. Of Advanced Industrial Sci. And Technol. (ai
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Yamada Yasusei
Material Research Institute For Sustainable Development National Institute Of Advanced Industrial Sc
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TAJIMA Kazuki
Material Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST)
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Yoshimura Kazuki
Material Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology
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Yoshimura Kazuki
Materials Research Institute for Sustainable Development, National Instititute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan
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Yamada Yasusei
Materials Research Institute for Sustainable Development, National Instititute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan
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Okada Masahisa
Materials Research Institute for Sustainable Development, National Instititute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan
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Tajima Kazuki
Material Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology
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